Andrew Rubio

Electrical engineering

Hometown: Yuma, Arizona, United States

Graduation date: Spring 2026

Additional details: First-generation college student, Honors student

FURI Semiconductor Research theme icon

FURI | Spring 2025

Conductive Filament Modeling and Reliability Prediction in Pt/SiOx/TiN

Many modern computing designs utilize the von Neumann architecture, where data and program instructions share the same memory bus. This leads to the “von Neumann bottleneck,” reducing efficiency due to the inability to transfer data and instructions simultaneously. A proposed solution lies in resistive random access memory (RRAM), an emerging memory device type that allows multiple data transfer pathways, bypassing the sequential transfer issue. This project aims to model and study the mechanisms and reliability of a CMOS-compatible, oxide-based RRAM device (Pt/SiOx/TiN), with successful results leading to the advancement of the integration of these devices into computing architectures.

Mentor:

QR code for the current page

It’s hip to be square.

Students presenting projects at the Fulton Forge Student Research Expo are encouraged to download this personal QR code and include it within your poster. This allows expo attendees to explore more about your project and about you in the future. 

Right click the image to save it to your computer.