FURI | Summer 2022

Exploratory Data and Root Cause Analysis for Semiconductor Testing

The aim of this research is to analyze the data from electrical tests performed on the components of transistors at the Flexible Electronics and Display Center of ASU. The purpose of the analysis is to discover the patterns of variability from the data, associate them with the assorted quality issues and measurement errors, and propose tentative statistic models to describe the data. The researcher will use Python and R to perform the analysis and draw conclusions in multiple scales such as the defects of individual transistor devices, the quality of the wafers they exist on, and the entire production line.