Arshtegh Singh Pannun
Mechanical engineering
Hometown: Deptford, New Jersey, United States
Graduation date: Spring 2025
Additional details: First-generation college student
FURI | Fall 2024, Summer 2024
Optimization of AFM Probes for More Accurate Characterization of Nano-Materials
The objective of this research is to optimize Atomic Force Microscopy (AFM) probes so that they can characterize nano-material with a higher degree of accuracy and precision while also improving the resolution of the AFM probe. This research aims to discover the most efficient geometry and material for an AFM probe tip and the most ideal length, width, tip length, and angles so that the probe achieves the same target stiffness, frequency, and tip radius of a commonly used AFM probe.
AFM is utilized in various industries including material science, semiconductors, and cell biology. The optimization of AFM probes will be extremely beneficial as it will improve the accuracy of the AFM measurements, thus paving the way for ground-breaking research and revolutionary discoveries for each of the industries. Optimizing AFM probes has the potential to pave the way to finding the cure to cancer due to the ability to analyze biological samples and even cell tissue at an extremely high resolution.
Mentor: Masoud Yekani Fard
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