Edward An Wang
Engineering (electrical)
Hometown: Flagstaff, AZ, US
Graduation date: Spring 2028
Additional details: Honors student
FURI | Fall 2026, Needs Review
Ion Migration and Degradation Caused by Stress Changes in Halide Perovskite Thin Films
Halide perovskites are low-cost and efficient materials for photovoltaic applications, but their stability under mechanical deformation needs to be taken into mind for flexible devices. This research investigates how mechanically induced stress influences the physical and electrical properties of halide perovskite thin films. Flexible samples fabricated on polyethylene substrates are deformed using curved blocks of varying radii to introduce controlled tensile or compressive stress. This work aims to establish a relationship between deformation and optoelectronic properties, providing a foundation to look at the potential effects of mechanical stress on ion migration and degradation for more reliable perovskite-based photovoltaic devices.
Mentor: Nick Rolston
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