Willem Sakuraoka Hurley

Mechanical engineering

Hometown: Idaho Falls, Idaho, United States

Graduation date: Spring 2026

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FURI | Summer 2025

Defect Luminescence in β – Ga2O3 for Next-Generation Power Electronics

Defect states in β-Ga₂O₃ can greatly alter its performance in high-power semiconductor applications. While some shallow defect states can enhance conductivity and radiative efficiency, deeper states can impede or halt charge carrier transport. Ultraviolet–visible (UV-vis) spectroscopy will be used to measure and extract the optical bandgap, complemented by a new technique called cryogenic thermally stimulated emission spectroscopy (C-TSES) to probe defect depth. Additionally, luminescence measurements will be used to gain deeper insight into charge transport phenomena. Insights from this analysis will guide optimization of growth and processing methods for bulk β-Ga₂O₃ for high-voltage, high-efficiency devices.

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