Guest Researcher | Spring 2025

Measurements of Microparticle-filled Thermal Interface Materials

FURI Semiconductor Research theme icon

This research initiative looks to perform precise thermal conductivity measurements of microparticle-filled composite materials acting as TIMs. Utilizing the American Society for Testing and Materials’ D5470 for measuring conductivity, this project is a steppingstone towards more sophisticated samples that will provide breakthrough thermal management research for semiconductors. This project investigates the effects of surface contact of microparticles and uses copper powder as the main driver for thermal conductivity in polymer composites. The researcher aims to devise accurate methodologies to measure conductivities of polymer composite TIMs, which will then be applied toward complex samples to tackle the heating issues of modern power electronics.

Student researcher

Bill Tran

Mechanical engineering

Hometown: Chandler, Arizona, United States

Graduation date: Spring 2025