FURI | Spring 2025

Characterization of Perovskite Semiconductors Under Radiation Exposure

Perovskite semiconductors exhibit unique properties, such as adjustable band gaps that enhance radiation tolerance and forms of self-healing, that make them promising for space applications. This research examines the elemental composition of perovskite materials (e.g., Cs0.2FA0.8PbI3, CsPbBr3) after exposure to 1 MRad of gamma radiation. Typically astronauts experience a radiation dose of 0.3-0.6 milligrays/day aboard the International Space Station (1 MRad = 10,000,000 milligrays). Post-exposure characterization is performed using photoluminescence and energy dispersive X-ray spectrometry with a scanning electron microscope to identify the optoelectronic and elemental changes in the distribution of the materials.